IEEE Conference on Communications and Network Security
30 May-1 June 2018 // Beijing // China

Technical Program Committee

Technical Program Co-chairs
Loukas Lazos, University of Arizona, USA
Peng Liu, Pennsylvania State University, USA

Area Chairs
Elisa Bertino, Purdue University, USA
Sabrina De Capitani di Vimercati, Universita degli Studi di Milano, Italy
Yingying Chen, Stevens Institute of Technology, USA
Reza Curtmola, New Jersey Institute of Technology, USA
Wenliang Du, Syracuse University, USA
Guofei Gu, Texas A&M University, USA

Zhi Wang, Florida State University, USA
Kai Zeng, George Mason University, USA
Yanchao Zhang, Arizona State University, USA

Technical Program Committee
Massimiliano Albanese, George Mason University, USA
Raheem A. Beyah, Georgia Institute of Technology, USA
Ehab Al-Shaer, University of North Carolina, Charlotte, USA
Erik-Oliver Blass, Airbus Group Innovations, Germany
Guohong Cao, Pennsylvania State University, USA
Bo Chen, Michigan Technological University, USA
Kai Chen, Chinese Academey of Sciences, PR China
Songqing Chen, George Mason University, USA
Xiuzhen Cheng, George Washington University, USA
Sherman S. M. Chow, The Chinese University of Hong Kong, Hong Kong
Mauro Conti, University of Padua, Italy
Bruno Crispo, Universita di Trento, Italy
Yingfei Dong, University of Hawaii, USA
Karim Eldefrawy, SRI International, USA
Sara Foresti, Università degli Studi di Milano, Italy
Xinwen Fu, University of Massachusetts Lowell, USA
Yanmin Gong, Oklahoma State University, USA
Le Guan, Pennsylvania State University, USA
Yong Guan, Iowa State University, USA
Linke Guo, Binghamton University, USA
Yuanxiong Guo, Oklahoma State University, USA
Matthias Hollick, Technische Universität Darmstadt, Germany
Nicholas Hopper, University of Minnesota, USA
Hongxin Hu, Clemson University, USA
Heqing Huang, IBM Research Labs (T. J. Watson Center), USA
Albert Levi, Sabanci University, Turkey
Ming Li, University of Arizona, USA
Qun Li, College of William and Mary, USA
Yao Liu, University of South Florida, USA
Wenjing Lou, Virginia Tech. & NSF, USA
Zhuo Lu, University of South Florida, USA
Ivan Martinovic, University of Oxford, UK
Ashraf Matrawy, Carleton University, Canada
Refik Molva, EURECOM, France
Miao Pan, University of Houston, USA
Jung-Min (Jerry) Park, Virginia Tech., USA
Chunyi Peng, Purdue University, USA
Vaibhav Rastogi, University of Wisconsin-Madison, USA
Walid Saad, Virginia Tech., USA
Seungwon Shin, KAIST, Korea
Tao Shu, Auburn University, USA
Craig A. Shue, Worcester Polytechnic Institute, USA
Aaron Striegel, University of Notre Dame, USA
Thorsten Strufe, TU Dresden, Germany
Jinyuan Sun, University of Tennessee, USA
Kun Sun, George Mason University, USA
Neeraj Suri, Technische Universitaet Darmstadt, Germany
Patrick Tague, Carnegie Mellon University, USA
Chiu Tan, Temple University, USA
Ravi Tandon, University of Arizona, USA
Qiang Tian, New Jersey Institute of Technology, USA
Ari Trachtenberg, Boston University, USA
Guan-Hua Tu, Michigan State Unversity, USA
Selcuk Uluagac, Florida International University, USA
Jaideep Vaidya, Rutgers University, USA
Cliff Wang, Army Research Office, USA
Haining Wang, University of Delaware, USA
Honggang Wang, University of Massachusetts Dartmouth, USA
Yan Wang, Binghamton University, USA
Zhi Wang, Florida State University, USA
Jun Xu, Pennsylvania State University, USA
Shouhuai Xu, University of Texas at San Antonio, USA
Guoliang Xue, Arizona State University, USA
Dejun Yang, Colorado School of Mines, USA
Jie Yang, Florida State University, USA
Meng Yu, University of Texas at San Antonio, USA
Shucheng Yu, University of Arkansas at Little Rock, USA
Wei Yu, Towson University, USA
David Zage, Intel Corporation, USA
Kai Zeng, George Mason University, USA
Qiang Zeng, Temple University, USA
Rui Zhang, University of Delaware, USA
Yifan Zhang, Binghamton University, USA
Yuqing Zhang, University of Chinese Academy of Sciences, PR China
Jianying Zhou, Singapore University of Technology and Design, Singapore
Haojin Zhu, Shanghai Jiao Tong University, PR China

Patrons